Details

Scan Statistics


Scan Statistics

Methods and Applications
Statistics for Industry and Technology

von: Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein

154,69 €

Verlag: Birkhäuser
Format: PDF
Veröffentl.: 24.12.2009
ISBN/EAN: 9780817647490
Sprache: englisch
Anzahl Seiten: 394

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Beschreibungen

Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
Filling a gap in the literature, this volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics. Key features include current results and new directions.
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.
Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
Key features:
* Chapters are written by leading experts in the field.
* Features many current results and highlights new directions for future research.
* Includes challenging theoretical methodological research problems.
* Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed.
* Real-world applications to areas such as bioinformatics and biosurveillance are emphasized.
* Contains extensive references to research articles, books, and relevant computer software.
Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.
Preface
Contributors
List of Tables
List of Figures
Joseph Naus: Father of the Scan Statistic \ S. Wallenstein
Precedence-Type Test for the Comparison of Treatments with a Control \ N. Balakrishnan and H. K. T. Ng
Extreme Value Results for Scan Statistics \ M. V. Boutsikas, M. V. Koutras, and F. S. Milienos
Boundary Crossing Probability Computations in the Analysis of Scan Statistics \ H. P. Chan, I-P. Tu, and N. R. Zhang
Approximations for Two-Dimensional Variable Window Scan Statistics \ J. Chen and J. Glaz
Applications of Spatial Scan Statistics: A Review \ M. A. Costa and M. Kulldorff
Extensions of the Scan Statistics for the Detection and Inference of Spatial Clusters \ L. Duczmal, A. R. Duarte, and R. Tavares
1-Dependent Stationary Sequences and Applications to Scan Statistics \ G. Haiman and C. Preda
Scan Statistics in Genome-Wide Scan for Complex Trait Loci \ J. Hoh and J. Ott
On Probabilities for Complex Switching Rules in Sampling Inspection \ W. Y. W. Lou and J. C. Fu
Bayesian Network Scan Statistics for Multivariate Pattern Detection \ D. B. Neill, G. F. Cooper, K. Das, X. Jiang, and J. Schneider
ULS Scan Statistic for Hotspot Detection with Continuous Gamma Response \ G. P. Patil, S. W. Joshi, W. L. Myers, and R. E. Koli
False Discovery Control for Scan Clustering \ M. Perone-Pacifico and I. Verdinelli
Martingale Methods for Patterns and Scan Statistics \ V. Pozdnyakov and J. M. Steele
How Can Pattern Statistics Be Useful for DNA Motif Discovery? \ S. Schbath and S. Robin
Occurrence of Patterns and Motifs in Random Strings \ V. T. Stefanov
Detection of Disease Clustering \ T. Tango
Index
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology.
Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
Key features:
* Chapters are written by leading experts in the field.
* Features many current results and highlights new directions for future research.
* Includes challenging theoretical methodological research problems.
* Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed.
* Real-world applications to areas such as bioinformatics and biosurveillance are emphasized.
* Contains extensive references to research articles, books, and relevant computer software.
 
Scan Statistics is an excellent reference for graduate students and researchers in applied probability and statistics, as well as for scientists in biology, computer science, pharmaceutical science, medicine, geography, quality control, communications, and epidemiology. The work may also be used as a textbook for a graduate-level seminar on scan statistics.
Presentation is accessible to statisticians as well as to scientists from other disciplines where scan statistics are employed
Many current results and new directions for future research are featured
Contains extensive references to research articles, books, and relevant computer software
May be used as a textbook for a graduate-level seminar on scan statistics
Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.